Local magnetic order in manganite thin films studied by 1/f noise measurements

P. Reutler, A. Bensaid, F. Herbstritt, C. Höfener, A. Marx, and R. Gross
Phys. Rev. B 62, 11619 – Published 1 November 2000
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Abstract

The low-frequency 1/f resistance fluctuations of epitaxial La2/3Ca1/3MnO3 thin films on different substrates have been studied as a function of temperature and applied magnetic field. A film with a high Curie temperature TC=250K grown on a substrate with perfect lattice match (NdGaO3) shows a low overall noise amplitude, comparable to that of a conventional metal. In contrast to previous work, no increase of the 1/f resistance noise in the ferromagnetic regime of the La2/3Ca1/3MnO3 film could be observed. The magnitude of the normalized resistance fluctuations decreases with decreasing temperature except for a sharp peak at TC; this peak is completely suppressed by an applied magnetic field of about 2 T. In contrast, the noise level in a film with low Curie temperature (TC=110K) grown on a substrate (SrTiO3) with large lattice mismatch (1.5%) is several orders of magnitude larger and shows a qualitatively different temperature dependence, with a huge noise increase below TC. These results are discussed in terms of a strong coupling of electric resistance and magnetic ordering, as well as within a percolative picture of the ferromagnetic transition.

  • Received 29 May 2000

DOI:https://doi.org/10.1103/PhysRevB.62.11619

©2000 American Physical Society

Authors & Affiliations

P. Reutler*, A. Bensaid, F. Herbstritt, and C. Höfener

  • II. Physikalisches Institut, Universität zu Köln, Zülpicherstraße 77, D-50937 Köln, Germany

A. Marx and R. Gross

  • II. Physikalisches Institut, Universität zu Köln, Zülpicherstraße 77, D-50937 Köln, Germany
  • Walther-Meißner-Institut für Tieftemperaturforschung, Walther-Meißner Straße 8, D-85748 Garching, Germany

  • *Present address: Laboratoire Physico-Chimie des Solides, Université Paris-Sud XI, 91405 Orsay Cedex, France.
  • Electronic address: Achim.Marx@wmi.badw.de

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Vol. 62, Iss. 17 — 1 November 2000

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