Modification of surface-enhanced Raman scattering spectra of single-walled carbon nanotubes as a function of nanotube film thickness

S. Lefrant, I. Baltog, M. Baibarac, J. Schreiber, and O. Chauvet
Phys. Rev. B 65, 235401 – Published 21 May 2002
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Abstract

In this paper we report modifications of the surface enhanced Raman scattering (SERS) spectra with film thickness of carbon single-walled nanotubes (SWNTs). The decrease of film thickness reveals an increased degree of disorder, which is interpreted in terms of degradation of the single-walled nanotubes and the formation of particles similar to highly oriented pyrolytic graphite (HOPG), C60 and amorphous carbon. The degradation of the nanotubes, dependent on the metal substrate type and its morphology, is explained on the basis of interactions between the nanotubes and the metal substrate. The D band, which is an indicator of the degree of disorder, increases its intensity when the film thickness is decreased. SERS spectra recorded at different excitation wavelengths reveal that metallic nanotubes are primarily affected. A mutual correlation was found between the variations in the relative intensity of the D band and the Breit-Wigner-Fano component due to metallic tubes displayed by Raman bands situated in the 15001600cm1 range. A direct interaction between C60 and nanotubes is revealed by comparative SERS spectra on SWNTs and (SWNTs+C60) films. At λexc=676.4nm the narrowing in the lower energy side of the broad band associated to tangential vibration modes indicates that the metallic tubes are involved in the formation of a [(SWNT)+C60] complex type.

  • Received 29 January 2001

DOI:https://doi.org/10.1103/PhysRevB.65.235401

©2002 American Physical Society

Authors & Affiliations

S. Lefrant

  • Institut de Matériaux de Nantes, Lab. de Physique Cristalline, 2 rue de la Houssinière, Boîte Postale 32229, 44322 Nantes, France

I. Baltog* and M. Baibarac

  • National Institute of Materials Physics, Lab. 160, Bucharest P.O. Box MG-7, R-76900, Romania

J. Schreiber and O. Chauvet

  • Institut de Matériaux de Nantes, Lab. de Physique Cristalline, 2 rue de la Houssinière, Boîte Postale 32229, 44322 Nantes, France

  • *Electronic address: ibaltog@alpha2.infim.ro; National Institute of Materials Physics, Lab. 160, Bucharest, P.O. Box MG-7, R-76900, Romania.

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Vol. 65, Iss. 23 — 15 June 2002

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