Deterministic electron ptychography at atomic resolution

A. J. D'Alfonso, A. J. Morgan, A. W. C. Yan, P. Wang, H. Sawada, A. I. Kirkland, and L. J. Allen

Phys. Rev. B 89, 064101 – Published 3 February 2014

Abstract

We present a fast deterministic approach to the ptychographic reconstruction of the transmission function of a specimen at atomic resolution. The method is demonstrated using a data set obtained from a cerium dioxide nanoparticle using an aberration-corrected electron microscope and is compared to established approaches to ptychography. The method is based on the solution of an overdetermined set of linear equations, and is computationally efficient and robust to measurement noise. The set of linear equations is efficiently solved using the conjugate gradient least squares method implemented using fast Fourier transforms.

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Received 23 August 2013
Revised 23 December 2013

DOI:https://doi.org/10.1103/PhysRevB.89.064101

Authors & Affiliations

A. J. D'Alfonso¹, A. J. Morgan¹, A. W. C. Yan¹, P. Wang^2,3, H. Sawada⁴, A. I. Kirkland³, and L. J. Allen¹

¹School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
²National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, People's Republic of China
³Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
⁴JEOL Ltd., 1-2 Musashino 3-Chome, Akishima, Tokyo 196, Japan

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Issue

Vol. 89, Iss. 6 — 1 February 2014

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covering condensed matter and materials physics