Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithms

Stephan Kassemeyer, Aliakbar Jafarpour, Lukas Lomb, Jan Steinbrener, Andrew V. Martin, and Ilme Schlichting
Phys. Rev. E 88, 042710 – Published 28 October 2013
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Abstract

Coherent diffractive imaging with x-ray free-electron lasers (XFEL) promises high-resolution structure determination of noncrystalline objects. Randomly oriented particles are exposed to XFEL pulses for acquisition of two-dimensional (2D) diffraction snapshots. The knowledge of their orientations enables 3D imaging by multiview reconstruction, combining 2D diffraction snapshots in different orientations. Here we introduce a globally optimal algorithm that can infer these orientations. We apply it to experimental XFEL data of nanoparticles and so determine their 3D electron density.

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  • Received 1 November 2012

DOI:https://doi.org/10.1103/PhysRevE.88.042710

©2013 American Physical Society

Authors & Affiliations

Stephan Kassemeyer1,2, Aliakbar Jafarpour1,2, Lukas Lomb1,2, Jan Steinbrener1,2, Andrew V. Martin3, and Ilme Schlichting1,2

  • 1Max-Planck-Institut für medizinische Forschung, Jahnstr. 29, 69120 Heidelberg
  • 2Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Notkestr. 85, 22607 Hamburg, Germany
  • 3ARC Centre of Excellence for Coherent X-ray Science, School of Physics, The University of Melbourne, Victoria 3010, Australia

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Issue

Vol. 88, Iss. 4 — October 2013

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