We present a method for determining inelastic mean free paths (IMFPs) in materials using high-accuracy measurements of x-ray absorption fine structure (XAFS). For electron energies below 100 eV, theoretical predictions have large variability and alternate measurement techniques exhibit significant uncertainties. In this regime, the short IMFP makes photoelectrons ideal for structural determination of surfaces and nanostructures, and measurements are valuable for studies of diverse fields such as low-energy electron diffraction and ballistic electron emission microscopy. Our approach, here applied to solid copper, is unique and exhibits enhanced sensitivity at electron energies below 100 eV. Furthermore, it is readily applicable to any material for which sufficiently high accuracy XAFS data can be obtained.

• Received 10 February 2010

DOI:https://doi.org/10.1103/PhysRevLett.104.206601