DNA Flexibility on Short Length Scales Probed by Atomic Force Microscopy

Alexey K. Mazur and Mounir Maaloum
Phys. Rev. Lett. 112, 068104 – Published 14 February 2014
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Abstract

Unusually high bending flexibility has been recently reported for DNA on short length scales. We use atomic force microscopy (AFM) in solution to obtain a direct estimate of DNA bending statistics for scales down to one helical turn. It appears that DNA behaves as a Gaussian chain and is well described by the wormlike chain model at length scales beyond 3 helical turns (10.5 nm). Below this threshold, the AFM data exhibit growing noise because of experimental limitations. This noise may hide small deviations from the Gaussian behavior, but they can hardly be significant.

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  • Received 14 October 2013

DOI:https://doi.org/10.1103/PhysRevLett.112.068104

© 2014 American Physical Society

Authors & Affiliations

Alexey K. Mazur

  • UPR9080 CNRS, Université Paris Diderot, Sorbonne Paris Cité, Institut de Biologie Physico-Chimique, 13, rue Pierre et Marie Curie, Paris, 75005, France

Mounir Maaloum

  • Institut Charles Sadron, CNRS–University of Strasbourg, 23 rue du Loess, BP 84087, 67034 Strasbourg cedex 2, France

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Vol. 112, Iss. 6 — 14 February 2014

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