Comparison of different methods of nitrogen-vacancy layer formation in diamond for wide-field quantum microscopy

A. J. Healey, A. Stacey, B. C. Johnson, D. A. Broadway, T. Teraji, D. A. Simpson, J.-P. Tetienne, and L. C. L. Hollenberg
Phys. Rev. Materials 4, 104605 – Published 29 October 2020

Abstract

Thin layers of near-surface nitrogen-vacancy (NV) defects in diamond substrates are the workhorse of NV-based wide-field magnetic microscopy, which has applications in physics, geology, and biology. Several methods exist to create such NV layers, which generally involve incorporating nitrogen atoms (N) and vacancies (V) into the diamond through growth and/or irradiation. While there have been detailed studies of individual methods, a direct side-by-side experimental comparison of the resulting magnetic sensitivities is still missing. Here we characterize, at room and cryogenic temperatures, 100nm-thick NV layers fabricated via three different methods: (1) low-energy carbon irradiation of N-rich high-pressure high-temperature (HPHT) diamond, (2) carbon irradiation of δ-doped chemical vapor deposition (CVD) diamond, (3) low-energy N+ or CN implantation into N-free CVD diamond. Despite significant variability within each method, we find that the best HPHT samples yield similar magnetic sensitivities (within a factor 2 on average) to our δ-doped samples, of <2μTHz1/2 for dc magnetic fields and <100nTHz1/2 for ac fields (for a 400nm ×400nm pixel), while the N+ and CN implanted samples exhibit an inferior sensitivity by a factor 2–5, at both room and low temperatures. We also examine the crystal lattice strain caused by the respective methods and discuss the implications this has for wide-field NV imaging. The pros and cons of each method, and potential future improvements, are discussed. This study highlights that low-energy irradiation of HPHT diamond, despite its relative simplicity and low cost, is a competitive method to create thin NV layers for wide-field magnetic imaging.

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  • Received 9 June 2020
  • Revised 3 September 2020
  • Accepted 8 October 2020

DOI:https://doi.org/10.1103/PhysRevMaterials.4.104605

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

A. J. Healey1, A. Stacey2,3, B. C. Johnson1,2, D. A. Broadway1,2, T. Teraji4, D. A. Simpson1, J.-P. Tetienne1,2,*, and L. C. L. Hollenberg1,2,†

  • 1School of Physics, University of Melbourne, Parkville, VIC 3010, Australia
  • 2Centre for Quantum Computation and Communication Technology, School of Physics, University of Melbourne, Parkville, VIC 3010, Australia
  • 3School of Science, RMIT University, Melbourne, VIC 3001, Australia
  • 4National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan

  • *jtetienne@unimelb.edu.au
  • lloydch@unimelb.edu.au

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Vol. 4, Iss. 10 — October 2020

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