Evidence of defect-induced ferromagnetism in ZnFe2O4 thin films

C. E. Rodríguez Torres, F. Golmar, M. Ziese, P. Esquinazi, and S. P. Heluani
Phys. Rev. B 84, 064404 – Published 11 August 2011

Abstract

X-ray absorption near-edge and grazing incidence x-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe2O4 thin films. The spectroscopy techniques are used to determine the nonequilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 103 mbar cause iron superoccupation of tetrahedral sites without Zn2+ inversion, resulting in an ordered magnetic phase with high room-temperature magnetic moment.

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  • Received 21 January 2011

DOI:https://doi.org/10.1103/PhysRevB.84.064404

©2011 American Physical Society

Authors & Affiliations

C. E. Rodríguez Torres1, F. Golmar2,*, M. Ziese3, P. Esquinazi3, and S. P. Heluani4

  • 1IFLP-CONICET and Departamento de Física, Facultad de Ciencias Exactas, Universidad Nacional de La Plata, C.C. 67 (1900) La Plata, Argentina
  • 2CIC nanoGUNE Consolider, Tolosa Hiribidea 76, 20018 Donostia, Spain
  • 3Division of Superconductivity and Magnetism, University of Leipzig, D-04103 Leipzig, Germany
  • 4Laboratorio de Física del Sólido, Dpto. de Física, FCEyT, Universidad Nacional de Tucumán, Tucumán, Argentina

  • *Also at On leave from I.N.T.I.-CONICET, Av. Gral. Paz 5445 Ed. 42, B1650JKA, San Martín, Bs As.

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Vol. 84, Iss. 6 — 1 August 2011

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