Three-dimensional characterization of Co/Pd multilayer thin films using resonant soft x-ray scattering

Samuel Flewett, Durgamadhab Mishra, Thiago J. A. Mori, Christian M. Günther, Juliano C. Denardin, Simón Oyarzún, Sebastián Michea, Dieter Engel, Manuel Fohler, Tulio C. R. Rocha, Alexandra Ovalle F., Leandro T. Núñez A., Bastian Pfau, Juan Escrig, and Stefan Eisebitt
Phys. Rev. B 95, 094430 – Published 29 March 2017

Abstract

In this work, we take a step toward nanometer resolution magnetic tomography, demonstrating the use of resonant magnetic x-ray scattering for three-dimensional (3D) characterization of Co/Pd multilayers. Trading coherence for x-ray flux, we measured magnetic scattering out to full period resolutions of 20 nm for incidence angles up to 75 from normal incidence, which was sufficient for a semiquantitative analysis of the 3D magnetic domain structure of such films. For the analysis of such patterns, we developed a scattering model based upon multiple plane propagation of the beam through the sample, taking into account the effects of multiple scattering not accounted for with Born or Rytov approximation based models. Our results demonstrate that 3D statistical characterization of nanoscale magnetic features is currently possible, and it is expected that the advent of high brilliance sources such as MAX IV in Sweden and SIRIUS in Brazil will provide the coherent flux necessary to permit the generalization of this work to nanometer resolution magnetic tomography.

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  • Received 15 September 2016
  • Revised 19 January 2017

DOI:https://doi.org/10.1103/PhysRevB.95.094430

©2017 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & OpticalCondensed Matter, Materials & Applied Physics

Authors & Affiliations

Samuel Flewett1,*, Durgamadhab Mishra2, Thiago J. A. Mori3, Christian M. Günther4, Juliano C. Denardin5, Simón Oyarzún5, Sebastián Michea5, Dieter Engel6, Manuel Fohler2, Tulio C. R. Rocha3, Alexandra Ovalle F.1, Leandro T. Núñez A.1, Bastian Pfau6, Juan Escrig5, and Stefan Eisebitt4,6

  • 1Instituto de Física, Pontificia Universidad Católica de Valparaíso, Avenida Universidad 330, Valparaíso, Chile
  • 2Helmholtz-Zentrum Berlin, Albert-Einstein-Straße 15, 12489 Berlin, Germany
  • 3Laboratorio Nacional de Luz Síncrotron–LNLS/CNPEM, Caixa Postal 6192, CEP 13083-970, Campinas SP, Brazil
  • 4Institut für Optik und Atomare Physik, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany
  • 5Departamento de Física, Universidad de Santiago de Chile, Avenida Ecuador 3493, Estación Central, Santiago, Chile
  • 6Max-Born-Institut, Max-Born-Straße 2a, 12489 Berlin, Germany

  • *samuel.flewett@gmail.com

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Issue

Vol. 95, Iss. 9 — 1 March 2017

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