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The program WEIS is used for the processing of macromolecular diffraction data recorded on a Weissenberg camera. Modifications have been made to WEIS in order to improve the number and quality of data obtained from integration over the diffraction peaks. Additional refinable parameters have been incorporated into the program in order to take account of small misalignments of the camera. Inclusion of these parameters in the refinement of the setting parameters results in a significantly better fit between the simulated and actual patterns. The modified program was used to process a set of diffraction data that had been collected using synchrotron radiation as the X-ray source and imaging plates as detectors. Improvement in the quality of the data was indicated by a significant increase in the number of accepted reflections per plate.
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