Astigmatic electron diffraction imaging: a novel mode for structure determination

In a conventional transmission electron microscope, stigmators are used to correct for the effects of axial astigmatism in the diffraction lens. It seems feasible that these same stigmators could also be used to form a series of `astigmatic' diffraction patterns. It is shown how this series of diffraction patterns could then be used to perform exit-surface wavefunction reconstruction. This has the advantage that the diffraction patterns are not resolution limited by the objective aperture as are images when performing exit-surface wavefunction reconstruction from a focal series. A scheme for carrying out phase reconstruction from a series of astigmatic diffraction patterns in an electron microscope is presented.