Paper
28 July 1994 Picosecond light-pulse-induced damage to diamond
Claude A. Klein, Richard P. Miller, Richard John DeSalvo
Author Affiliations +
Abstract
We report on picosecond laser-induced damage experiments that were carried out on a natural type-IIa diamond and a thick specimen of high-quality chemically vapor-deposited (CVD) diamond. In conjunction with earlier measurements performed elsewhere on an `optically thick' single crystal, it is shown that for spot sizes (2 (omega) ) ranging from 3 to 60 micrometers , the breakdown field strength (EBD) at the damage threshold of diamond obeys a pattern best described as follows: EBD approximately equals A/(root)2(omega) , where A equals 30.7 and 38.7 MV(mu) 1/2/cm at 532 and 1064 nm, respectively. The case of CVD diamond demonstrates that, if problems arising from localized high absorption at the deposition surface can be avoided, this material should be of much promise for contemplated high-power free-electron laser window applications. We show that corrections for self- focusing in laser damage experiments depend not only on the peak pulse power but also on the position of the diffraction prefocus and the length of the Rayleigh range.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Claude A. Klein, Richard P. Miller, and Richard John DeSalvo "Picosecond light-pulse-induced damage to diamond", Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); https://doi.org/10.1117/12.180932
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Diamond

Chemical vapor deposition

Laser damage threshold

Picosecond phenomena

Laser induced damage

Absorption

Crystals

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