Paper
28 August 1995 Fault diagnosis of dynamic memory board
Feng Zhou
Author Affiliations +
Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217514
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
In this paper, we describe the logic function of the memory unit (MEU) board, a type of dynamic random access memory unit which includes a refresh circuit for data retention, and present a fault detection and location algorithm based on the fault models we describe. This method has been used to diagnose the MEU board of AXE-10 SPC digital telephone system.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Feng Zhou "Fault diagnosis of dynamic memory board", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217514
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KEYWORDS
Silicon

Diagnostics

Data modeling

Detection and tracking algorithms

Information operations

Logic

Binary data

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