Presentation + Paper
30 May 2022 Using spectroscopic ellipsometry and single-angle reflectance to derive accurate optical constants for chemical forms of aspartame
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Abstract
Variable angle spectroscopic ellipsometry and single-angle infrared reflectance methods have been used to derive the complex optical constants n and k in the mid-infrared spectral region for aspartame. Aspartame exists in four unique forms: three of which incorporate water into the lattice, as well as the anhydrate form. The different forms can induce splitting or slight wavenumber shifts in the spectral features. Pressed pellets of neat powder were prepared and measured using both methods to derive the optical constants. Different n and k values were obtained depending on the percentage of the forms of aspartame, which was determined using powder X-ray diffraction (XRD) analysis.
Conference Presentation
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Michael O. Yokosuk, Karissa L. Jensen, Jeremy D. Erickson, Danielle L. Saunders, Mark E. Bowden, Timothy J. Johnson, and Tanya L. Myers "Using spectroscopic ellipsometry and single-angle reflectance to derive accurate optical constants for chemical forms of aspartame", Proc. SPIE 12116, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XXIII, 1211608 (30 May 2022); https://doi.org/10.1117/12.2619853
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KEYWORDS
Spectroscopic ellipsometry

Infrared spectroscopy

Data modeling

Oscillators

Refractive index

Solids

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