Paper
22 September 1999 Near-field optical microscopy: contrast mechanisms in standard systems and photonic band gap structures
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Abstract
We discuss some of the intrinsic difficulties related to the numerical investigation of near-field optical microscopy. We show how these difficulties can be handled within the framework of the Green's tensor technique. Investigating practical experimental configurations, we show the strong correlation between the motion of the tip and the near-field signal. In order to investigate this kind of artifacts, we propose a series of experiments based on photonic band gap systems immersed in evanescent fields. The electromagnetic properties of such a system can be changed without changing the topography of the system at all.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olivier J.F. Martin "Near-field optical microscopy: contrast mechanisms in standard systems and photonic band gap structures", Proc. SPIE 3791, Near-Field Optics: Physics, Devices, and Information Processing, (22 September 1999); https://doi.org/10.1117/12.363859
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KEYWORDS
Near field

Optical microscopy

Signal detection

Near field optics

Electromagnetism

Dielectric polarization

Dielectrics

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