Paper
19 November 2003 Investigation on overpoled lithium niobate patterned crystal
Author Affiliations +
Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529994
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
We investigate the domain structure obtained on overpoled both sides polished z-cut Lithium Niobate crystal sample by applying an electric field on periodic liquid electrodes. Lithium Niobate sample was spatially patterned with photoresist by use of interference photolithographic process. The sample was then etched in a mixture of hydrofluoric and nitric acid to reveal the reversed domains. The different etch rate of the two opposite z faces of the crystal domains allowed to measure the surface profile of the sample by using a profilometer. Overpoling the crystal caused the appearance of high density and submicrometer spacing single dot domains vertically aligned along the direction of the interference fringes in the patterned region. (Summary only available)
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Simonetta Grilli, Sergio M. De Nicola, Pietro Ferraro, Andrea Finizio, Paolo De Natale, Mario Iodice, and Giovanni Pierattini "Investigation on overpoled lithium niobate patterned crystal", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.529994
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Cited by 3 scholarly publications.
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KEYWORDS
Crystals

Lithium niobate

Liquid crystals

Electrodes

Etching

Profilometers

Wafer-level optics

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