Improved techniques for measuring x-ray mass attenuation coefficients

Martin D. de Jonge; Chanh Q. Tran; Christopher T. Chantler; Zwi Barnea

doi:10.1117/12.549711

14 October 2004 Improved techniques for measuring x-ray mass attenuation coefficients

Martin D. de Jonge, Chanh Q. Tran, Christopher T. Chantler, Zwi Barnea

Proceedings Volume 5538, Optical Constants of Materials for UV to X-Ray Wavelengths; (2004) https://doi.org/10.1117/12.549711
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We have applied the x-ray extended-range technique (XERT) to measure mass attenuation coefficients over one order of magnitude more accurately than previously reported in the literature. We describe here the application of the XERT to the investigation of a number of systematic effects which has enabled us to ensure that these recent measurements are free from systematic error. In particular we describe our techniques for quantifying the effects of harmonic components in the x-ray beam, scattering and fluorescence from the absorbing sample, the bandwidth of the x-ray beam, and thickness variations across the absorber.

Citation Download Citation

Martin D. de Jonge, Chanh Q. Tran, Christopher T. Chantler, and Zwi Barnea "Improved techniques for measuring x-ray mass attenuation coefficients", Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, (14 October 2004); https://doi.org/10.1117/12.549711

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