Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements

Catherine Wykes

doi:10.1117/12.7972922

1 June 1982 Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements

Catherine Wykes

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Optical Engineering, Vol. 21, Issue 3, 213400 (June 1982). https://doi.org/10.1117/12.7972922

Abstract

Electronic speckle pattern interferometry (ESPI) enables static and dynamic surface displacements to be measured in real time to an accuracy of the order of a wavelength of light. The principles of the technique are outlined and the different configurations of interferometers described. Some applications of the technique are discussed.

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Catherine Wykes "Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements," Optical Engineering 21(3), 213400 (1 June 1982). https://doi.org/10.1117/12.7972922

Published: 1 June 1982

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