Paper
21 February 2011 Lattice mismatched growth for mid-IR VECSELs
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Abstract
We demonstrate a novel epitaxial process for the growth of low-dislocation density GaSb on GaAs. The growth mode involves the formation of large arrays of periodic 90° misfit dislocations at the interface between the two binary alloys which results in a completely strain relieved III-Sb epi-layer without the need for thick buffer layers. This epitaxial process is used for the growth of antimonide active regions directly on GaAs/AlGaAs distributed Bragg Reflectors (DBRs) resulting in 2 μm VECSELs on GaAs substrates.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Balakrishnan, T. J. Rotter, P. Ahirwar, S. P. Clark, V. Patel, A. Albrecht, C. P. Hains, Yi-Ying Lai, T. L. Wang, J. M. Yarborough, D. Mathine, Yushi Kaneda, Jerome V. Moloney, Jörg Hader, and S. W. Koch "Lattice mismatched growth for mid-IR VECSELs", Proc. SPIE 7919, Vertical External Cavity Surface Emitting Lasers (VECSELs), 79190G (21 February 2011); https://doi.org/10.1117/12.874234
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Cited by 3 scholarly publications.
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KEYWORDS
Gallium arsenide

Gallium antimonide

Quantum wells

Mid-IR

Interfaces

Distributed Bragg reflectors

Antimony

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