Automated Optical Inspection Of Multilayer Printed Circuit Boards

William A. Bentley

doi:10.1117/12.958586

28 May 1980 Automated Optical Inspection Of Multilayer Printed Circuit Boards

William A. Bentley

Proceedings Volume 0220, Optics in Metrology and Quality Assurance; (1980) https://doi.org/10.1117/12.958586
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States

Abstract

The Inspectron is an instrument which will perform an automatic optical inspection of the etched circuitry on the individual layers of a multilayer printed circuit board. The concept of this instrument is unique in that it does not compare the PCB under test with a master or with computer-stored data. Instead, as the board is optically scanned, a small area is re-imaged onto a detector array. The detector signals, after digitization, are fed into high-speed logic circuitry which is programmed to distinguish between the appearance of a good board and an error. An 8 x 10 inch board can be inspected for line width, line spacing, line breaks, excess copper, and voids in about a minute. The Inspectron can also inspect pads for completeness and ground planes for shorts.

Citation Download Citation

William A. Bentley "Automated Optical Inspection Of Multilayer Printed Circuit Boards", Proc. SPIE 0220, Optics in Metrology and Quality Assurance, (28 May 1980); https://doi.org/10.1117/12.958586

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available