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Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review)

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Abstract

The current state of the art in one of the most promising techniques of X-ray spectral analysis, namely, total reflection X-ray fluorescence analysis (TXRF), is summarized. The underlying physical processes, including reflection, refraction, total external reflection (TER) of X-rays, and formation of standing waves by TER, are considered. The construction and crucial components of a modern energy-dispersive TXRF spectrometer, involving X-ray tubes, monochromators, detectors, and reflectors, are described. Examples of analytical application of TXRF are given. High efficiency of this technique for qualitative and quantitative chemical analysis of liquids and solids of various natures is demonstrated. The main research trends in surface analysis and investigation of surface layers of solids by TXRF are discussed.

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    N. V. Alov

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Original Russian Text © N.V. Alov, 2010, published in Zavodskaya Laboratoriya. Diagnostika materialov, 2010, Vol. 76, No. 1, pp. 4–14.

The article was prepared on the basis of the Proceedings of the VI All-Russian Conference on X-Ray Spectral Analysis (Krasnodar, 2008) and the Moscow Seminar on Analytical Chemistry (Moscow, GEOKhI, 2009).

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Alov, N.V. Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review). Inorg Mater 47, 1487–1499 (2011). https://doi.org/10.1134/S0020168511140020

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