Abstract—
Nanocrystalline PdO films have been characterized by X-ray diffraction, scanning electron microscopy, and electron probe microanalysis. The results demonstrate that thermal oxidation in an O2 atmosphere causes ~35-nm-thick nanocrystalline Pd films on SiO2/Si(100) substrates to undergo a sequence of phase transformations resulting in PdO formation, followed by PdO decomposition into metallic Pd at T > 1120 K. In the range 670–970 K, the a and c tetragonal cell parameters of the nanocrystalline PdO films increase monotonically with increasing temperature. The present and previously reported data have been used to construct a model for the unit cell in the crystal structure of palladium(II) oxide. Based on the quasi-chemical approach, we propose a model that accounts for the observed increase in the tetragonal cell parameters and the p-type conductivity of the nanocrystalline PdO films in terms of the formation of excess interstitial oxygen atoms.
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This work was supported by the Russian Federation Ministry of Science and Higher Education through the state research targets for the higher education institutions in 2020–2022, project no. 3 FZGU-2020-0036.
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Translated by O. Tsarev
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Samoylov, A.M., Ivkov, S.A., Pelipenko, D.I. et al. Structural Changes in Palladium Nanofilms during Thermal Oxidation. Inorg Mater 56, 1020–1026 (2020). https://doi.org/10.1134/S0020168520100131
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DOI: https://doi.org/10.1134/S0020168520100131