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Diffraction reflection of a focused X-ray wave by a multilayer crystal

  • Diffraction and Scattering of Ionizing Radiations
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Abstract

The Bragg diffraction of a narrow X-ray beam in a multilayer crystal is studied in the reflection geometry. It is shown by computer simulation of the experiment that strong integrated kinematic reflection occurs at any boundary of a multilayer crystal at the point of intersection of a narrow beam with the boundary. In contrast to the dynamic diffraction of a plane wave, attenuation of a narrow incident beam due to the reflection is small in comparison with the conventional absorption. As an example of a multilayer crystal, a Fabry-Perot interferometer is considered, which consists of two 70-μm-thick crystal Si layers separated by a 100-μm-thick air layer. The 12 4 0 reflection is studied at a photon energy of 15 keV. Three methods of formation of a narrow beam are considered: wavefront limitation by a slit, focusing with a parabolic lens, and focusing with a zone plate. It is shown that, for a local analysis of the thickness of layers and scattering parameters, the method of parabolic lens focusing has some advantages in comparison with the other methods.

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Authors and Affiliations

  1. Russian Research Centre Kurchatov Institute, pl. Akademika Kurchatova 1, 123182, Moscow, Russia

    V. G. Kohn

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  1. V. G. Kohn
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Original Russian Text © V.G. Kohn, 2006, published in Kristallografiya, 2006, Vol. 51, No. 4, pp. 605–610.

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Kohn, V.G. Diffraction reflection of a focused X-ray wave by a multilayer crystal. Crystallogr. Rep. 51, 564–569 (2006). https://doi.org/10.1134/S1063774506040043

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  • DOI: https://doi.org/10.1134/S1063774506040043

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