Abstract
The technology of producing a Ge–GeS:Nd heterojunction and the relative spectral characteristics of the quantum efficiency of the fabricated heterojunction are investigated at different γ-irradiation doses. It is found that the photosensitivity increases at a dose of 30 krad in the spectral range of 0.4–2.0 μm. With increasing the radiation dose to 100 krad, the heterojunction photosensitivity decreases significantly.
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Alekperov, A.S., Dashdemirov, A.O., Ismayilova, N.A. et al. Fabrication of a Ge–GeS:Nd Heterojunction and Investigation of the Spectral Characteristics. Semiconductors 54, 1406–1409 (2020). https://doi.org/10.1134/S1063782620110044
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DOI: https://doi.org/10.1134/S1063782620110044