Abstract
Over recent synchrotron experiments and publications we have devel- oped methods for measuring the absorption coefficient in the XAFS (X-ray Absorption Fine Structure) region and far from an edge in neutral atoms, simple compounds and organometallics which can reach accuracies of below 0.02%. This is 50–500 times more accurate than earlier methods, and 50–250 times more accurate than claimed uncertainties in theoretical computations for these systems. The data and methodology is useful for a wide range of applications, including dominant synchrotron and laboratory techniques relating to fine structure, near-edge analysis and standard crystallography. The experiments are sensitive to many theoretical and computational issues, including correlation and convergence of individual electronic and atomic orbitals and wavefunctions.
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Chantler, C. Development and applications of accurate measurement of X-ray absorption. Eur. Phys. J. Spec. Top. 169, 147–153 (2009). https://doi.org/10.1140/epjst/e2009-00985-8
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DOI: https://doi.org/10.1140/epjst/e2009-00985-8