Carrier Mobilities in Insulating Polymers Measured by Time of Flight Method

, and

Copyright (c) 1975 The Japan Society of Applied Physics
, , Citation Kotaku Hayashi et al 1975 Jpn. J. Appl. Phys. 14 39 DOI 10.1143/JJAP.14.39

1347-4065/14/1/39

Abstract

Carrier mobilities of several insulating polymers such as PET, PS were studied by the time of flight method using pulsed electron beam bombardment. For example, the mobilities obtained in an electric field of 1∼2 MV/cm were 2×10-5 cm2/V·sec for the electron and 1×10-4 cm2/V·sec for the hole at 27 °C in PET with the activation energy around 0.3 eV. At low field mainly the slow carrier component due to detrapping was observed, which apparently gave a much lower mobility. The carrier lifetime was also estimated from the Hecht curve. It was found that the quantum yield (number of induced carriers per impinging electron) was influenced seriously by the molecular structure.

Export citation and abstract BibTeX RIS

10.1143/JJAP.14.39