Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering

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Copyright (c) 1981 The Japan Society of Applied Physics
, , Citation Masakazu Aono et al 1981 Jpn. J. Appl. Phys. 20 L829 DOI 10.1143/JJAP.20.L829

1347-4065/20/11/L829

Abstract

A new technique for analyzing the quantitative surface atomic geometry and the two-dimensional surface electron distribution is reported. The remarkable effectiveness of this new technique is demonstrated for TiC(111).

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10.1143/JJAP.20.L829