GaInAsP/InP DH Laser with a Current Blocking Layer Made by Be Implantation

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Copyright (c) 1982 The Japan Society of Applied Physics
, , Citation Seiji Uchiyama et al 1982 Jpn. J. Appl. Phys. 21 L639 DOI 10.1143/JJAP.21.L639

1347-4065/21/10A/L639

Abstract

A GaInAsP/InP laser (λ=1.3 µm) with a current blocking layer made by Be implantation has been fabricated. Be-ions were implanted with 70 keV into an n-InP substrate at room temperature and 2.2×1014 cm-2 of dose. Thermal annealing was applied in a furnace during the LPE (Liquid Phase Epitaxial) growth. The breaking of the forward bias associated with the blocking region was 2 V. The minimum threshold current was 160 mA for 2.5 µm width of waveguide and 250 µm cavity length.

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10.1143/JJAP.21.L639