Imaging Characteristics of Multi-Phase-Shifting and Halftone Phase-Shifting Masks

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Copyright (c) 1991 The Japan Society of Applied Physics
, , Citation Tsuneo Terasawa et al 1991 Jpn. J. Appl. Phys. 30 2991 DOI 10.1143/JJAP.30.2991

1347-4065/30/11S/2991

Abstract

Phase-shifting masks and imaging characteristics are discussed and compared with those of conventional transmission masks. Then, new phase-shifting masks with intermediate values of phase shifting or transmittance are proposed, and their imaging characteristics are investigated. A phase-shifting mask with a 90° phase difference can ease the restrictions on pattern geometries used in phase-shifting technology but does not increase the focus latitude. It is also suggested that a halftone phase-shifting mask is suitable for printing isolated patterns and it gives wider focus latitude than conventional mask technology.

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10.1143/JJAP.30.2991