Formation of Polysilicon Films by Catalytic Chemical Vapor Deposition (cat-CVD) Method

Copyright (c) 1991 The Japan Society of Applied Physics
, , Citation Hideki Matsumura Hideki Matsumura 1991 Jpn. J. Appl. Phys. 30 L1522 DOI 10.1143/JJAP.30.L1522

1347-4065/30/8B/L1522

Abstract

Silicon films are deposited by a new plasma-free and low-temperature deposition technique, the catalytic chemical vapor deposition (cat-CVD) method, in which deposition gases are decomposed by reactions with a heated catalyzer placed near substrates. It is found that polysilicon films of a grain size of around 0.1 µm can be easily obtained at substrate temperatures lower than 450°C by this cat-CVD method when gas pressure Pg is below a certain critical value, although films are amorphous even for substrate temperatures higher than 450°C when Pg is larger than such a critical gas pressure.

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10.1143/JJAP.30.L1522