Characterization of Planar Semipolar Gallium Nitride Films on Spinel Substrates

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Published 8 July 2005 Copyright (c) 2005 The Japan Society of Applied Physics
, , Citation Troy J. Baker et al 2005 Jpn. J. Appl. Phys. 44 L920 DOI 10.1143/JJAP.44.L920

1347-4065/44/7L/L920

Abstract

Specular, planar semipolar gallium nitride films were grown by hydride vapor phase epitaxy. This is the first report of high quality semipolar GaN films that could be used for device growth. Planar films of (10-1-1)GaN have been grown on (100)MgAl2O4 spinel, and planar films of (10-1-3)GaN have been grown on (110)MgAl2O4 spinel. The in-plane epitaxial relationship for (10-1-1)GaN on (100) spinel was [10-1-2]GaN ∥[011]spinel and [1-210]GaN ∥[0-11]spinel. The in-plane epitaxial relationship for (10-1-3)GaN on (110) spinel was [30-3-2]GaN ∥[001]spinel and [1-210]GaN ∥[-110]spinel.

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10.1143/JJAP.44.L920