A Vertical Insulated Gate AlGaN/GaN Heterojunction Field-Effect Transistor

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Published 25 May 2007 Copyright (c) 2007 The Japan Society of Applied Physics
, , Citation Masakazu Kanechika et al 2007 Jpn. J. Appl. Phys. 46 L503 DOI 10.1143/JJAP.46.L503

1347-4065/46/6L/L503

Abstract

We fabricated a vertical insulated gate AlGaN/GaN heterojunction field-effect transistor (HFET), using a free-standing GaN substrate. This HFET has apertures through which the electron current vertically flows. These apertures were formed by dry etching the p-GaN layer below the gate electrodes and regrowing n--GaN layer without mask. The HFET exhibited a specific on-resistance of as low as 2.6 mΩ·cm2 with a threshold voltage of -16 V. This HFET would be a prototype of a GaN-based high-power switching device.

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10.1143/JJAP.46.L503