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Automata-based Pattern Mining from Imperfect Traces

Published:06 February 2015Publication History
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Abstract

This paper considers automata-based pattern mining techniques for extracting specifications from runtime traces and suggests a novel extension that allows these techniques to work with so-called imperfect traces i.e. traces that do not exactly satisfy the intended specification of the system that produced them. We show that by taking a so-called edit-distance between an input trace and the language of a pattern we can extract specifications from imperfect traces and identify the parts of an input trace that do not satisfy the mined specification, thus aiding the identification and location of errors in programs.

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    • Published in

      cover image ACM SIGSOFT Software Engineering Notes
      ACM SIGSOFT Software Engineering Notes  Volume 40, Issue 1
      January 2015
      237 pages
      ISSN:0163-5948
      DOI:10.1145/2693208
      Issue’s Table of Contents

      Copyright © 2015 Authors

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 6 February 2015

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