The Dielectric Breakdown of Anodic Aluminum Oxide

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© 1976 ECS - The Electrochemical Society
, , Citation H. J. de Wit et al 1976 J. Electrochem. Soc. 123 1479 DOI 10.1149/1.2132623

1945-7111/123/10/1479

Abstract

Nonshorting breakdowns of anodic alumina films, 200–2500Å thick, have been measured. These measurements reveal the existence of a thickness‐independent breakdown field which is close to the anodizing field. The existing theories, which make use of electron avalanching, cannot explain these facts and it is suggested that the breakdown is initiated by ionic movement and that it is related to the anodizing process.

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