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Internal Standards for Quantitative X-Ray Phase Analysis: Crystallinity and Solid Solution

Published online by Cambridge University Press:  06 March 2019

G.J. McCarthy ,
R.C. Gehringer ,
D.K. Smith ,
V.M. Injaian ,
D.E. Pfoertsch  and
R.L. Kabel
G.J. McCarthy
Affiliation:
Department of Chemistry, North Dakota State University, Fargo, ND 58105
R.C. Gehringer
Affiliation:
Department of Chemistry, North Dakota State University, Fargo, ND 58105
D.K. Smith
Affiliation:
Departments of Geosciences, The Pennsylvania State University, University Park, PA 16802
V.M. Injaian
Affiliation:
Chemical Engineering, The Pennsylvania State University, University Park, PA 16802
D.E. Pfoertsch
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
R.L. Kabel
Affiliation:
Chemical Engineering, The Pennsylvania State University, University Park, PA 16802
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Extract

Quantitative phase analysis by X-ray diffraction (QTXRD) has been an established tool of analytical chemistry for more than four decades. Despite its age, this tool remains ascendant as the only universally applicable method for determining the manner in which elements are combined into crystalline phases in multiphase solids. QTXRD is entering its second renaissance. The first came with the introduction of the counter diffractometer in the late 1940's. The specimen preparation and data collection processes were exacting and tedious, but reasonably accurate analyses could be obtained. The second came with the introduction of computer controlled diffractometers, whose software packages include QTXRD routines, in the late 1970's. With the tedium of data collection and analysis greatly reduced, we can expect even more widespread adoption of this tool in the general analytical laboratory.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 253 - 264
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

References Cited

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