Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-13T02:09:38.770Z Has data issue: false hasContentIssue false
  • English
  • Français

Study of the Precision of X-ray Stress Analysis

Published online by Cambridge University Press:  06 March 2019

M. R. James  and
J. B. Cohen
M. R. James
Affiliation:
The Technological Institute, Northwestern University Evanst on, 111inois 60201
J. B. Cohen
Affiliation:
The Technological Institute, Northwestern University Evanst on, 111inois 60201
Get access

Abstract

Software is described for complete computer control of residual stress measurements. One program (that incorporates either the two tilt method, the sins| procedure, or the Cohen-Marion technique) has been developed for use with either a normal detector or a position sensitive detector. The operator inputs the desired error in stress and various instrumental parameters that determine systematic errors. The counting strategy to obtain the total error is then determined by the software.

Employing this automated system, an investigation of a parabolic fit to the top of a diffraction profile indicates that a three point fit is satisfactory only for sharp profiles.

Type
X-Ray Diffraction Stress Analysis
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 291 - 307
Copyright
Copyright © International Centre for Diffraction Data 1976

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Jatczak, C. and Boehm, H., “The Effects of X-Ray Optics on Residual Stress Measurements in Steel”, Advances in X-Ray Analysis, Vol. 17, p. 354, Plenum Press (1973).Google Scholar
2. Jatczak, C. and Zantopulos, H., “Systematic Errors in Residual Stress Measurements Due to Specimen Geometry”, Advances in X-Ray Analysis, Vol. 14, p. 360, Plenum Press (1970).Google Scholar
3. Koistinen, D. P. and Marburger, R. E., “Calculating Peak Positions in X-Ray R.S. Measurements on Hardened Steel”, Trans. ASM 51, 537 (1959).Google Scholar
4. Short, M. and Kelly, C., “Intensity Correction Factors for X-Ray Diffraction Measurements of Residual Stress”, Advances in X-Ray Analysis, Vol. 16, p. 379 (1972).Google Scholar
5. Fukura, J. and Fumiwara, H., “Evaluation of Various Techniques of X-Ray Stress Measruement With the Diffractometer”, Journal Soc. Mat. Sci., Japan, 15, No. 159, 825 (1966).Google Scholar
6. Kelly, C. and Eichen, E., “Computer Controlled X-Ray Diffraction Measurements of Residual Stress”, Advances in X-Ray Analysis, Vol. 16, p. 344, Plenum Press (1972).Google Scholar
7. Hayatna, T. and Hashimoto, S., “Automation of X-Ray Stress Measurement by Small Digital Computer”, Journal Soc, Mat. Sci., Japan, 24, 75 (1975).Google Scholar
8. Marion, R. H. and Cohen, J. B., “Anomalies in Measurement of Residual Stress by X-Ray Diffraction”, Advances in X-Ray Analysis, Vol. 18, p. 466, Plenum Pless (1974).Google Scholar
9. H. S. 182, J784, “Residual Stress Measurement by X-Ray Diffraction”, Soc. Autom. Engr., SAE, New York (1971).Google Scholar
10. Schneider, D. and Smith, B., “PS/8 FOCAL 1971”, STUDENT RESEARCH CENTER, OMSI (1971).Google Scholar
11. Marion, R. H., Ph.D. Thesis, Northwestern University, Evanston, Illinois (1972).Google Scholar
12. Wilson, A. J. C., “The Location of Peaks”, Brit. J. Appl. Phys., 16, 665 (1975).Google Scholar
13. James, M. R. and Cohen, J. B., “The Application of a Position Sensitive Detector to the Measurement of Residual Stresses”, Advances in X-Ray Analysis, Vol. 19, p. 695 (1975).Google Scholar
14. Kirk, D., “Experimental Features of Residual Stress Measurement by X-Ray Diffractometry”, Strain, January 1971, p. 7.Google Scholar
15. Kelly, C. and Short, M., “Error in Residual Stress Measurement due to Random Counting Statistics”, Advances in X-Ray Analysis, Vol. 14, p. 377 (1972).Google Scholar
16. Yap, F. Y., Dissertation, The John Hopkins University, Baltimore, Maryland (1967).Google Scholar
17. McClintock, F. A. and Argon, A. S., “Mechanical Behavior of Metals”, p. 86, Addison-Wesley (1966).Google Scholar
18. Cohen, J. B., unpublished results.Google Scholar
19. French, D. N., “X-Ray Stress Analysis of WC-Co Cerroats; II, Temperature Stresses”, J. Amer. Cer. Soc., 52, 271 (1969).Google Scholar
20. “X-Ray Studies on Mechanical Behavior of Materials”, Journal Soc. Mat. Sci., Japan, p. 89 (1974).Google Scholar
21. Aoyama, S., Satta, K. and Tada, M., “The Effect of Setup Errors on the Accuracy of Stress Measured with the Parallel Beam Diffractometer”, Journal Soc. Mat. Sci., Japan, 17, No, 183, 1071 (1968).Google Scholar
22. Macherauch, E., “X-Ray Stress Analysis”, Proc. Soc. Exp. Mechanics, 23, 140 (1966).Google Scholar
23. Norton, J. T., “X-Ray Stress Measurement by the Single-Exposure Technique”, Advances in X-Ray Analysis, Vol. 11, p. 401, Plenum Press (1967).Google Scholar
24. James, M. R., Ph.D. Thesis, Northwestern University, Evanston, Illinois (1977).Google Scholar
25. Herglotz, H. K., “Miniature X-Ray Equipment for Diffraction and Fluoresence Analysis”, Advances in X-Ray Analysis, Vol. 16, p. 260, Plenum Press (1972).Google Scholar