Abstract
In this paper a novel buffer layer architecture consisting of LaMnO3/MgO/TiN is proposed as a suitable structural and chemical template for the epitaxial growth of high-transition temperature (Tc) superconductors on Cu metal surfaces. Using techniques such as high-energy electron diffraction and scanning transmission electron microscopy, we present in situ and ex situ analyses of the buffer-layer and superconductor growth with focus on structural properties of the interfaces formed. While MgO is a good barrier to oxygen diffusion, we find that MgO alone is not a suitable buffer layer due to rapid Cu diffusion. Further, growth of MgO with a single epitaxy can be hindered by the presence of impurities such as S, which form strongly bonded superstructures on the metal surface. With the addition of a TiN layer as a barrier to Cu diffusion, oxide formation is suppressed, interfaces are clean, and a single cube-on-cube epitaxy is observed. While the Cu/TiN and TiN/MgO interfaces are rough, the MgO and LaMnO3 layers planarize the material, leading to growth of smooth YBa2Cu3O7−δ (YBCO). Residual strain in the YBCO film is 0.25% or less and does not lead to apparent cracking. The superconducting properties of the samples were investigated by electrical transport and magnetization measurements. For the first time, high critical current density (Jc) values are reported for YBCO films grown on (001) single-crystal and 100‹100›?textured Cu surfaces without intervening metal coatings. Jc on single crystal-like substrates is as high as 3.5 MA/cm2. Reduced Jc of approximately 1 MA/cm2 on rolled Cu tapes is limited by damage to the tape surface during the rolling process.
Similar content being viewed by others
References
A. Goyal, D.P. Norton, J.D. Budai, M. Paranthaman, E.D. Specht, D.M. Kroeger, D.K. Christen, Q. He, B. Saffian, F.A. List, D.F. Lee, P.M. Martin, C.E. Klabunde, E. Hartfield, and V.K. Sikka, Appl. Phys. Lett. 69, 1795 (1996).
A. Goyal, E.D. Specht, D.M. Kroeger, and M. Paranthaman, U.S. Patent No. 5 964 966 (12 October 1999).
A. Goyal, R. Feenstra, M. Paranthaman, J.R. Thompson, B.W. Kang, C. Cantoni, D.F. Le, F.A. List, P.M. Martin, E. Lara-Curio, C. Stevens, D.M. Kroeger, M. Kowalewski, E.D. Specht, T. Aytug, S. Sathyamurthy, R.K. Williams, and R.E. Ericson, Physica C 382, 251 (2002).
W. Prusseit, R. Nemetschek, R. Semerad, B. Holzaphel, and J. Erickemeyer, Program and extended abstract of the Fifth International Workshop on Superconductivity co-sponsored by ISTEC and MRS (Honolulu, Hawaii, 2001), p. 87.
V. Boffa, T. Petrisor, C. Annino, F. Fabbri, D. Bettinelli, G. Celentano, L. Ciontea, U. Gambardella, G. Grimaldi, A. Mancini, and V. Galluzi, Eur. Conf. Appl. Supercond. (1999).
T. Petrisor, V. Boffa, G. Celentano, L. Ciontea, F. Fabbri, U. Gambardella, S. Ceresara, and P. Scardi, IEEE Trans. Appl. Supercond. 9, 2256 (1999).
B. de Boer, N. Reger, L. Fernandez G.R., J. Elickemeyer, P. Berberich, W. Prusseit, B. Holzapfel, and L. Schultz, IEEE Trans. Appl. Supercond. 11, 3477 (2001).
C.L.H. Thieme, S. Annavarapu, W. Zhang, V. Prunier, L. Fritzemeier, G. Li, U. Schoop, M.W. Rupich, M. Gopal, S.R. Foltyn, and T. Holesinger, IEEE Trans. Appl. Supercond. 11, 3329 (2001).
T. Watanabe, Y. Ohashi, M. Ozaki, K. Yamamoto, T. Maeda, K. Wada, and I. Hirabayashi, Program and extended abstracts of the Fifth International Workshop on Superconductivity co-sponsored by ISTEC and MRS (Honolulu, Hawaii, 2001), p. 21.
G. Yuan, J. Yang, and K. Shi, IEEE Trans. Appl. Supercond. 11, 3328 (2001).
J.R. Thompson, A. Goyal, D.K. Christen, and D.M. Kroeger, Physica C 370, 169 (2002).
D.T. Verebelyi, U. Schoop, C. Thieme, X. Li, W. Zhang, T. Kodenkandath, A.P. Malozemoff, N. Nguyen, E. Siegal, D. Buczek, J. Lynch, J. Scudiere, M. Rupich, A. Goyal, E.D. Specht, P. Martin, and M. Paranthaman, Supercond. Sci. Technol. 16, L19 (2003).
A. Goyal, D.M. Kroeger, M. Paranthaman, D.F. Lee, R. Feenstra, and D.P. Norton, U.S. Patent No. 6 451 450 (17 September 2002).
C. Cantoni, T. Aytug, D.T. Verebelyi, M. Paranthaman, E.D. Specht, D.P. Norton, and D.K. Christen, IEEE Trans. Appl. Supercond. 11, 3309 Part 3 (2001).
Y. Fu, O. Tsukamoto, and M. Furse, IEEE Trans. Appl. Supercond. 13, 1780 (2003).
S. Mrowec and K. Przybylski, Oxid. Met. 6, 365 (1977).
K. Fueki and J.B. Wagner, J. Electrochem. Soc. 112, 384 (1965).
S. Mrowec and A. Stoklosa, Oxid. Met. 3, 291 (1971).
T.D. Sullivan, in Stress Induced Phenomena in Metallization, edited by O. Kraft, E. Arzt, C.A. Volkert, P.S. Ho, and H. Okabayashi, AIP Conference Proceedings No. 491 (1999), pp. 39–50.
T. Aytug, A. Goyal, N. Rutter, M. Paranthaman, J.R. Thompson, H.Y. Zhai, and D.K Christen, J. Mater. Res. 18, 872 (2003).
C. Cantoni, D.K. Christen, L. Heatherly, M.M. Kowalewski, F.A. List, A. Goyal, G.W. Ownby, D.M. Zehner, B.W. Kang, and D.M. Kroeger, J. Mater. Res. 17, 2549 (2002).
C. Cantoni, D.K. Christen, R. Feenstra, D.P. Norton, A. Goyal, G.W. Ownby, and D.M. Zehner, Appl. Phys. Lett. 79, 3077 (2001).
F.A. List and D. Lee, Continuous Processing and Characterization of Coated Conductors, presented at the 2002 DOE Peer Review, July 17–19, Washington D.C., available from http:// www.ornl.gov/HTSC/fy02peer.htm.
J.L. Domange and J. Oudar, Surf. Sci. 11, 124 (1968).
M.L. Colaianni, P. Syhler, and I. Chorkendorff, Phys. Rev. B: Condens. Matter 52, 2076 (1995).
M.L. Colaianni and I. Chorkendorff, Phys. Rev. B: Condens. Matter 50, 8798 (1994).
S. Rousset, S. Gauthier, O. Siboulet, W. Sacks, M. Belin, and J. Klein, Phys. Rev. Lett. 63, 1265 (1989).
M-H. Yang and C.P. Flynn, J. Phys.: Condens. Matter 8, L279 (1996).
P.S. Manning, J.D. Sirman, and J.A. Kilner, Solid State Ionics 93, 125 (1997).
C. Cantoni, D.K. Christen, J.R. Thompson, M. Paranthaman, H.Y. Zhai, and A. Goyal (unpublished).
I. Kim, P.N. Barnes, A. Goyal, S.A. Barnett, R. Biggers, G. Kozlowski, C. Varanasi, I. Maartens, R. Nekkanti, T. Peterson, T. Haughan, and S. Sambasivan, Physica C 377, 227 (2002).
S-Q. Wang, I. Raaijmakers, B.J. Burrow, S. Suthar, S. Redkar, and K-B. Kim, J. Appl. Phys. 68, 5176 (1990).
D.P. Norton, A. Goyal, J.D. Budai, D.K. Christen, D.M. Kroeger, E.D. Specht, Q. He, B. Saffian, M. Paranthaman, C.E. Klabunde, D.F. Lee, B.C. Sales, and F.A. List, Science 274, 755 (1996).
S.J. Pennycook and P.D. Nellist, in Impact of Electron and Scanning Probe Microscopy on Materials Research, edited by D.G. Rickerby, U. Valdré, and G. Valdré (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 161–207.
A.F. Marshall, K. Char, R.W. Barton, A. Kapitulnik, and S.S. Laderman, J. Mater. Res. 5, 2049 (1990).
M. Varela, A.R. Lupini, S.J. Pennycook, Z. Sefrioui, and J. Santamaria, Solid-State Electron. (2003, in press).
C. Park, D.P. Norton, J.D. Budai, D.K. Christen, D. Verebelyi, and R. Feenstra, Appl. Phys. Lett. 73, 1904 (1998).
D.T. Verebelyi, C. Cantoni, J.D. Budai, D.K. Christen, H.J. Kim, and J.R. Thompson, Appl. Phys. Lett. 78, 2031 (2001).
D.T. Verebelyi, D.K. Christen, R. Feenstra, C. Cantoni, A. Goyal, D.F. Lee, M. Paranthaman, P.N. Arendt, R.F. De Paula, J.R. Groves, and C. Prouteau, Appl. Phys. Lett. 76, 1755 (2000).
R. Feenstra, Ex-Situ Growth of YBCO Thick Films by the BaF2 Process, presented at the 2002 DOE Peer Review on high-Tc superconductivity, Washington D.C., July 2002, available from http://www.ornl.gov/HTSC/fy02peer.htm.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Cantoni, C., Christen, D.K., Varela, M. et al. Deposition and characterization of YBa2Cu3O7−δ/LaMnO3/MgO/TiN heterostructures on Cu metal substrates for development of coated conductors. Journal of Materials Research 18, 2387–2400 (2003). https://doi.org/10.1557/JMR.2003.0334
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.2003.0334