Abstract
We present results of extremely short carrier lifetime measurements on a series of hydrogenated nanocrystalline silicon (nc-Si:H) thin films by a novel, non-destructive, non-contact method. Transmission modulated photoconductive decay (TMPCD) is a newly developed technique which appears to have high enough sensitivity and time resolution to measure the extremely short carrier lifetimes on the order of a nanosecond. As a proof of this, we measure various nc-Si:H samples of varying crystalline volume fraction as well as a fully amorphous sample. To ascribe an effective lifetime to the materials, we use a simple model which assumes a single exponential decay. By using this model, effective lifetimes can be deconvoluted from our pump beam giving nanosecond lifetimes. Lifetimes of between 1.9 and 0.9 nanoseconds are reported and trend to decreasing lifetimes as crystalline volume fraction is increased.
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Simonds, B.J., Yan, B., Yue, G. et al. Measure of carrier lifetime in nanocrystalline silicon thin films using transmission modulated photoconductive decay. MRS Online Proceedings Library 1245, 1611 (2009). https://doi.org/10.1557/PROC-1245-A16-11
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DOI: https://doi.org/10.1557/PROC-1245-A16-11