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A Self-Similar Solution for the Growth Rate of a Compound Layer in Thin-Film Binary Diffusion Couples

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Abstract

The diffusion controlled growth of a compound phase AnB between two thin films of material A and B is studied with the nonlinear Kirkendall effect included. Previous models of the growth rate do not solve the diffusion equation, and thus do not fully utilize the predictive capability. This paper describes a self-similar transformation that reduces the nonlinear, time-dependent diffusion equation with two free boundaries into a nonlinear ordinary differential equation, which is solved numerically by a shooting method. It is found that the intrinsic diffusion coefficients of A and B in AnB can be determined from the positions of the interfaces without using the concentration profile. This provides a simpler method for measuring intrinsic diffusion coefficients.

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Authors and Affiliations

  1. Mechanical Eng. Dept, Louisiana State University, Baton Rouge, LA, 70803, USA

    Huifang Zhang & Harris Wong

Authors
  1. Huifang Zhang
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  2. Harris Wong
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Correspondence to Huifang Zhang.

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Zhang, H., Wong, H. A Self-Similar Solution for the Growth Rate of a Compound Layer in Thin-Film Binary Diffusion Couples. MRS Online Proceedings Library 580, 309–314 (1999). https://doi.org/10.1557/PROC-580-309

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  • DOI: https://doi.org/10.1557/PROC-580-309

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