Abstract
We studied the low frequency noise in top-contact pentacene Thin Film Transistors (TFTs). The relative spectral noise density of the drain current fluctuations SI/I2 had a form of 1/f noise in the measured frequency range 1Hz - 3.5kHz.
Our studies of the noise dependencies on the gate-source VGS and drain-source VDS voltages showed that the dependencies differed from those observed for conducting polymers and resembled those reported for crystalline Si n-MOSFETs.
To compare the device noise level with those of other devices and materials, we extracted the Hooge parameter α. In order to calculate the total number of carriers we used a model simulating the device DC characteristics, similar to that for amorphous Si TFTs. The extracted Hooge parameter was 0.04. For an organic material this is an extremely small value, which is three orders of magnitude smaller that the Hooge parameter values reported for conducting polymers and only several times higher than the values for amorphous Si TFTs.
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References
D. J. Gundlach, C. C. Kuo, S. F. Nelson, T. N. Jackson, 57th Device Research Conference Digest, p. 164–165, (June 1999)
A. Y.-Y. Lin, R. Dodabalapur, Z. Sarpeshkar, W. Bao, K. Li, V. Baldwin, R. Raju, and H. E. Katz, Applied Physics Letters, vol. 74, p. 2714–2716, (1999)
M. Bonse, D. B. Thomasson, H. Klauk, D. J. Gundlach, T. N. Jackson, 1998 International Electron Devices Meeting Technical Digest, p. 1080, 249–52 (1998)
L. K. J. Vandamme, X. Li, D. Rigaud, IEEE Transactions on Electron Devices, V. 41, No. 11, pp. 1936–44., (1994)
Y. Y. Lin, D. J. Gundlach, S. F. Nelson, and T. N. Jackson, IEEE Transaction on Electron Devices, vol. 44, No. 8, p. 320–325 (1997)
E. G. Guk, M. E. Levinshtein, V. A. Markhin, L. P. Myasnikova and S. L. Rumyantsev, Phys. Solid. State, v.39, N4, p.690, (1997)
J. Chang, A. A. Abbidy, C. R. Vishnanathan, IEEE Transactions on Electron Devices, v. 41, No. 11, pp. 1965–71, (1994)
F. N. Hooge, IEEE Transactions on Electron Devices, vol 41, No 11, (1994)
P. V. Necliudov, M. S. Shur, D. J. Gundlach, T. N. Jackson, ISDRS - 99 Proceedings, p. 373–376; (1999).
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Necliudov, P.V., Gundlach, D.J., Jackson, T.N. et al. 1/f Noise Behavior in Pentacene Organic Thin Film Transistors. MRS Online Proceedings Library 598, 1154 (1999). https://doi.org/10.1557/PROC-598-BB11.54
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DOI: https://doi.org/10.1557/PROC-598-BB11.54