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Aspects of Gas Phase Chemistry During Chemical Vapor Deposition of Ti−Si−N Thin Films With Ti(NMe2)4 (TDMAT), NH3, and SiH4

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Abstract

Silane activation, predominantly in the gas phase, has been observed during the chemical vapor deposition of Ti-Si-N thin films using Ti(NMe2)4, tetrakis(dimethylamido)titanium, silane, and ammonia at 450°C, using molecular beam mass spectrometry. The extent of silane reactivity was dependent upon the relative amounts of Ti(NMe2)4and NH3. Additionally, each TDMAT molecule activates multiple silane molecules. Ti-Si-N thin films were deposited using similar process conditions as the molecular beam experiments, and RBS and XPS were used to determine their atomic composition. The variations of the Ti:Si ratio in the films as a function of Ti(NMe2)4 and NH3 flows were consistent with the changes in silane reactivity under similar conditions.

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Correspondence to Carmela Amato-Wierda.

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Amato-Wierda, C., Norton, E.T. & Wierda, D.A. Aspects of Gas Phase Chemistry During Chemical Vapor Deposition of Ti−Si−N Thin Films With Ti(NMe2)4 (TDMAT), NH3, and SiH4. MRS Online Proceedings Library 606, 97 (1999). https://doi.org/10.1557/PROC-606-97

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