Title |
Optimizing Room Temperature RF Structures for Accelerator Driven System Operations |
Authors |
- D.L. Brown, M.T. Crofford
ORNL, Oak Ridge, Tennessee, USA
- C.C. Peters
ORNL RAD, Oak Ridge, Tennessee, USA
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Abstract |
Minimizing beam trip rates is one of the key operational goals at the Spallation Neutron Source (SNS). Trip rates are closely monitored, and real-time statistics are kept during beam operations for immediate analysis. Beam trips are automatically binned by the length of the trip along with the cause for each trip. The shortest beam trips occur with the highest frequency and those trip rates are dominated by the room temperature RF structures. There can be many causes for the RF structure malfunctions, but one area that has had a major impact on trip rates is improvement in how RF processing is done on structures after extended maintenance periods. Details about the improvement in RF conditioning will be discussed.
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Funding |
This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. |
Paper |
download WEPRB075.PDF [1.679 MB / 3 pages] |
Export |
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Conference |
IPAC2019 |
Series |
International Particle Accelerator Conference (10th) |
Location |
Melbourne, Australia |
Date |
19-24 May 2019 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
Online ISBN |
978-3-95450-208-0 |
Received |
13 May 2019 |
Accepted |
21 May 2019 |
Issue Date |
21 June 2019 |
DOI |
doi:10.18429/JACoW-IPAC2019-WEPRB075 |
Pages |
2993-2995 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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