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The Properties of Passivation Films on Al2O3/SiNX Stack Layer in Crystalline Silicon Solar Cells

결정질 실리콘 태양전지의 Al2O3/SiNX 패시베이션 특성 분석

  • Hyun, Ji Yeon (Department of Materials Science and Engineering, Korea University) ;
  • Song, In Seol (KU KIST Green School, Graduated school of Energy and Environment, Korea University) ;
  • Kim, Jae Eun (Department of Materials Science and Engineering, Korea University) ;
  • Bae, Soohyun (Department of Materials Science and Engineering, Korea University) ;
  • Kang, Yoonmook (KU KIST Green School, Graduated school of Energy and Environment, Korea University) ;
  • Lee, Hae-Seok (KU KIST Green School, Graduated school of Energy and Environment, Korea University) ;
  • Kim, Donghwan (Department of Materials Science and Engineering, Korea University)
  • 현지연 (신소재공학과, 고려대학교) ;
  • 송인설 (그린스쿨대학원, 고려대학교) ;
  • 김재은 (신소재공학과, 고려대학교) ;
  • 배수현 (신소재공학과, 고려대학교) ;
  • 강윤묵 (그린스쿨대학원, 고려대학교) ;
  • 이해석 (그린스쿨대학원, 고려대학교) ;
  • 김동환 (신소재공학과, 고려대학교)
  • Received : 2017.06.06
  • Accepted : 2017.06.10
  • Published : 2017.06.30

Abstract

Aluminum oxide ($Al_2O_3$) film deposited by atomic layer deposition (ALD) is known to supply excellent surface passivation properties on crystalline Si surface. The quality of passivation layer is important for high-efficiency silicon solar cell. double-layer structures have many advantages over single-layer materials. $Al_2O_3/SiN_X$ passivation stacks have been widely adopted for high- efficiency silicon solar cells. The first layer, $Al_2O_3$, passivates the surface, while $SiN_X$ acts as a hydrogen source that saturates silicon dangling bonds during annealing treatment. We explored the properties on passivation film of $Al_2O_3/SiN_X$ stack layer with changing the conditions. For the post annealing temperature, it was found that $500^{\circ}C$ is the most suitable temperature to improvement surface passivation.

Keywords

References

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