X-ray Line Profile Analysis (XLPA) is a powerful and convenient method to investigate the dislocation density, crystallite size and nature (screw or edge) and arrangement of dislocation in a material. Microstructural observation by Scanning Transmission Electron Microscope (STEM) and XLPA were performed on low-energy ball milled iron powder. It was found that XLPA can be applied to low-energy and short-time ball milled iron powder. Dislocations were found to be concentrated on the surface of the particles by STEM observation, and XLPA was also evaluated on the surface of the particles.