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Extreme Light Diagnostics

  • LABORATORY ASTROPHYSICS, HIGH ENERGY DENSITY PROCESSES, DIAGNOSTICS, AND OTHER APPLICATIONS
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Abstract

The generation of high-power short laser pulses of ultrarelativistic intensity (over 1020 W/cm2) using the XCELS [1] infrastructure and their application to solve problems of laser-plasma interaction and acceleration of charged particles, as well as problems of quantum electrodynamics, require correct diagnostics of the laser pulse parameters in the interaction region upon sharp focusing. An approach is proposed for measuring the key parameters of the XCELS beam, such as its size in the caustic and the peak laser intensity. The proposed method is based on using the process of vacuum acceleration of charged particles—electrons and protons—from the focal volume. When using the distribution of the laser pulse fields near the focus using the Stratton-Chu diffraction integrals and the test particle method, the characteristics of accelerated electrons and ions (for example, the energies of accelerated particles and their emission angles) can be accurately quantified. The latter allows us to offer a practically accessible experimental method for diagnosing radiation in a single laser shot and the design of the XCELS experiment.

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Funding

This work was supported in part by the Russian Foundation for Basic Research (grant no. 20-21-00023) and the Theoretical Physics and Mathematics Advancement Foundation “BASIS” (grant no. 22-1-3-28-1). The authors from the Lomonosov Moscow State University acknowledge the support of the Ministry of Education and Science of the Russian Federation within the framework of the national project “Science and Universities.”

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Authors and Affiliations

  1. Lebedev Physical Institute, Russian Academy of Sciences, 119991, Moscow, Russia

    O. E. Vais, K. A. Ivanov, V. Yu. Bychenkov, Ph. A. Korneev & A. B. Savel’ev

  2. Dukhov All-Russian Scientific Research Institute of Automation (VNIIA), 127055, Moscow, Russia

    O. E. Vais & V. Yu. Bychenkov

  3. Federal Research Center Institute of Applied Physics, Russian Academy of Sciences, 603950, Nizhny Novgorod, Russia

    O. E. Vais, K. A. Ivanov, I. N. Tsymbalov, N. D. Bukharskii, V. Yu. Bychenkov, Ph. A. Korneev & A. B. Savel’ev

  4. Lomonosov Moscow State University, 119991, Moscow, Russia

    K. A. Ivanov, I. N. Tsymbalov & A. B. Savel’ev

  5. National Research Nuclear University MEPhI, 115409, Moscow, Russia

    N. D. Bukharskii & Ph. A. Korneev

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  1. O. E. Vais
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  2. K. A. Ivanov
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  3. I. N. Tsymbalov
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  4. N. D. Bukharskii
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  5. V. Yu. Bychenkov
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  6. Ph. A. Korneev
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  7. A. B. Savel’ev
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Correspondence to O. E. Vais.

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Vais, O.E., Ivanov, K.A., Tsymbalov, I.N. et al. Extreme Light Diagnostics. Bull. Lebedev Phys. Inst. 50 (Suppl 8), S933–S941 (2023). https://doi.org/10.3103/S1068335623200150

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  • DOI: https://doi.org/10.3103/S1068335623200150

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