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{'doi': '10.3367/ufne.2019.05.038623', 'member_id': '1936', 'member': 'Uspekhi Fizicheskikh Nauk (UFN) Journal', 'container-title': 'Physics-Uspekhi', 'primary-resource': 'https://iopscience.iop.org/article/10.3367/UFNe.2019.05.038623', 'tld': 'iop.org', 'clearbit-logo': 'https://logo.clearbit.com/iop.org', 'coaccess': [], 'multiple-resolution': [{'url': 'https://ufn.ru/en/articles/2020/1/g/', 'tld': 'ufn.ru', 'clearbit-logo': 'https://logo.clearbit.com/ufn.ru'}], 'type': 'JOURNAL ARTICLE', 'published_date': '1 January 2020', 'publication': 'Physics-Uspekhi', 'supplementary_ids': None, 'title': 'Beryllium-based multilayer X-ray optics', 'name': None, 'id': None, 'location': None, 'display_doi': 'https://doi.org/10.3367/ufne.2019.05.038623', 'grant_info': None, 'editors': None, 'authors': 'V N Polkovnikov | N N Salashchenko | M V Svechnikov | N I Chkhalo', 'chairs': None}
https://doi.org/10.3367/ufne.2019.05.038623
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