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Reducing Design Margins by Adaptive Compensation for Thermal and Aging Variations

Reducing Design Margins by Adaptive Compensation for Thermal and Aging Variations

Zhenyu Qi, Yan Zhang, Mircea Stan
Copyright: © 2012 |Pages: 30
ISBN13: 9781466618398|ISBN10: 1466618396|EISBN13: 9781466618404
DOI: 10.4018/978-1-4666-1839-8.ch009
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MLA

Wen-Chen Hu and Naima Kaabouch. "Reducing Design Margins by Adaptive Compensation for Thermal and Aging Variations." Sustainable ICTs and Management Systems for Green Computing, IGI Global, 2012, pp.201-230. https://doi.org/10.4018/978-1-4666-1839-8.ch009

APA

W. Hu & N. Kaabouch (2012). Reducing Design Margins by Adaptive Compensation for Thermal and Aging Variations. IGI Global. https://doi.org/10.4018/978-1-4666-1839-8.ch009

Chicago

Wen-Chen Hu and Naima Kaabouch. "Reducing Design Margins by Adaptive Compensation for Thermal and Aging Variations." In Sustainable ICTs and Management Systems for Green Computing. Hershey, PA: IGI Global, 2012. https://doi.org/10.4018/978-1-4666-1839-8.ch009

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Abstract

Corner-based design and verification are based on worst-case analysis, thus introducing over-pessimism and large area and power overhead and leading to unnecessary energy consumption. Typical case-based design and verification maximize energy efficiency through design margins reduction and adaptive computation, thus helping achieve sustainable computing. Dynamically adapting to manufacturing, environmental, and usage variations is the key to shaving unnecessary design margins, which requires on-chip modules that can sense and configure design parameters both globally and locally to maximize computation efficiency, and maintain this efficiency over the lifetime of the system. This chapter presents an adaptive threshold compensation scheme using a transimpedance amplifier and adaptive body biasing to overcome the effects of temperature variation, reliability degradation, and process variation. The effectiveness and versatility of the scheme are demonstrated with two example applications, one as a temperature aware design to maintain IONto IOFFcurrent ratio, the other as a reliability sensor for NBTI (Negative Bias Temperature Instability).

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