AOI Multi-Core Parallel System for TFT-LCD Defect Detection

Hua Zhong Li; Yong Sheng Liang; Tao He; Yi Li

doi:10.4028/www.scientific.net/AMR.472-475.2325

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Design of Dual-Channel High-Speed Data Acquisition Card Based on USB 3.0 and FPGA
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 472-475AOI Multi-Core Parallel System for TFT-LCD Defect...

AOI Multi-Core Parallel System for TFT-LCD Defect Detection

Abstract:

The present Automatic Optical Inspection (AOI) technology can hardly satisfy online inspection requirements for large-scale high-speed, high-precision and high-sensitivity TFT-LCD. First, through studying the working principle of TFT-LCD Defect AOI System, the system architecture for mixed-parallel multi-core computer cluster is proposed to satisfy design requirements. Second, the study focuses on the software framework of AOI system and related key software technology. Finally, the fusion programming model for parallel image processing and its implementation strategy is proposed based on OpenMP, MPI, OpenCV, and Intel Integrated Performance Primitives (IPP).

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Advanced Manufacturing Technology, ICMSE 2012

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Periodical:

Advanced Materials Research (Volumes 472-475)

Pages:

2325-2331

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.472-475.2325

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Online since:

February 2012

Authors:

Hua Zhong Li, Yong Sheng Liang, Tao He, Yi Li

Keywords:

Automatic Optical Inspection, Fusion Programming Model, Intel Integrated Performance Primitives, Multi-Core Cluster, System Architecture, TFT-LCD

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