Ultrasonic TOFD in the Application of Thick Wall Tube Welding Seam Detection Pre-Research

Cheng Lu; Qi Wang; Fang Nan Liu

doi:10.4028/www.scientific.net/AMR.912-914.12

Paper Titles

Preface and Committee

Damage Analysis for Multilayer Composite Material
p.3

Dynamic Properties of NiTi Shape Memory Alloy under Combined Compression-Shear Loading
p.7

Ultrasonic TOFD in the Application of Thick Wall Tube Welding Seam Detection Pre-Research
p.12

Effect of Calcination Temperature on the Structure and Electrochemical Performance of LiNi_0.4Co_0.2Mn_0.4O₂
p.18

Effect of High Temperature Stays Process on Ultra-Low-Carbon Bainitic Steel without Nb, Ti and other Metal Compounds Forming Elements
p.23

Experimental Research and Simulation Analysis on Composite Structure Embedded Optical Fiber Sensor under Impact Load
p.27

Magnetic Properties of Nano Zerovalent Iron Particles Coated with Biopolymers
p.32

Acoustic Emission Attenuation and Source Location of Resin Matrix for Wind Turbine Blade Composites
p.36

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 912-914Ultrasonic TOFD in the Application of Thick Wall...

Ultrasonic TOFD in the Application of Thick Wall Tube Welding Seam Detection Pre-Research

Abstract:

This article firstly introduces the ultrasonic TOFD (Time-of-flight - Diffraction) detection technology of detection principle, advantages and disadvantages, and then summarizes the ultrasonic TOFD technique related testing standard, finally combining the reality of tube mill, analyses the pipe material testing near the surface of the blind area and radian impact problems, discusses the ultrasonic TOFD in application prospect in the field of thick wall tube welding seam detection.

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Periodical:

Advanced Materials Research (Volumes 912-914)

Pages:

12-17

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.912-914.12

Citation:

Cite this paper

Online since:

April 2014

Authors:

Cheng Lu*, Qi Wang, Fang Nan Liu

Keywords:

Scanning, Thick Wall Tube Welding, TOFD, Ultrasonic, Weld Detection

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* - Corresponding Author

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