Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System

Yen Liang Yeh; Cheng Chi Wang; Ming Jyi Jang; Yen Pin Lin; Kuang Sheng Chen

doi:10.4028/www.scientific.net/KEM.364-366.510

Paper Titles

ASPHERO5 – Simulation and Analysis of Aspherical Polishing Process
p.488

Microstructure Optics Designed for LED Traffic Signal Lighting
p.493

Solution for Best Fitting Spherical Curvature Radius and Asphericity of Off-Axis Aspherics of Optical Aspheric Surface Component
p.499

Optical Modeling and Analysis of Laser Centering Tester
p.504

Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System
p.510

Analysis on the Performance of Differential Confocal Pointing Signal
p.516

Method of Analyzing the Singlet F-Theta Scan Lens for Laser Drilling System
p.521

Advanced Smart High Ratio Zoom System with Global Optimization
p.527

Analysis and Optical Design of 1:1 Projection Lithography System
p.533

HomeKey Engineering MaterialsKey Engineering Materials Vols. 364-366Determining the Thickness and Refractive Index of...

Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System

Abstract:

This paper presents a high-precision, non-destructive measurement system for determining the thickness and refractive indices of birefringent optical wave plates. Significantly, the proposed method enables the two refractive indices of the optical sample to be measured simultaneously. The performance of the proposed system is verified using a commercial quartz optical wave plate with known refractive indices of 1.5518 e n = and 1.5427 o n = , respectively, and a thickness of 452.1428 μm. The experimentally determined values of the refractive indices are found to be 1.55190 e n = and 1.54281 o n = , respectively, while the thickness is found to be 452.189 μm, corresponding to an experimental error of approximately 0.046 μm. The measurement resolution of the proposed system exceeds that of the interferometer hardware itself and provides a simple yet highly accurate means of measuring the principal optical parameters of birefringent glass wave plates.